منابع مشابه
Aberration corrected emittance exchange
The MIT Faculty has made this article openly available. Please share how this access benefits you. Your story matters. Full exploitation of emittance exchange (EEX) requires aberration-free performance of a complex imaging system including active radio-frequency (rf) elements which can add temporal distortions. We investigate the performance of an EEX line where the exchange occurs between two ...
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Precession electron diffraction (PED) is a promising technique for collecting high quality diffraction patterns for rapid nanoscale structural characterization [1]. It is able to reduce dynamical scattering effects, improving the interpretability of diffraction intensities over those obtained by conventional electron diffraction techniques. When used on a microscope that can produce a fine prob...
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Cryogenic fluorescent light microscopy of flash-frozen cells stands out by artifact-free fixation and very little photobleaching of the fluorophores used. To attain the highest level of resolution, aberration-free immersion objectives with accurately matched immersion media are required, but both do not exist for imaging below the glass-transition temperature of water. Here, we resolve this cha...
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In a scanning transmission electron microscope (STEM), the elemental analysis at atomic resolution is realized by the combination with electron energy-loss spectroscopy (EELS), since an aberration corrected probe forming lens system enables us to obtain an electron probe sized about 0.1 nm [1]. In EELS, the energy resolution is mainly limited by the energy spread of the electron source, which i...
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INTRODUCTION AS VLSI (very large scale integration) technology evolves toward ever smaller features and multilayer designs, analysis and control of structures and compositions at the atomic level is becoming increasingly important. In 1998 Hitachi HighTechnologies Corporation released the HD-2000, a STEM (scanning transmission electron microscope) that was very well received for combining the e...
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ژورنال
عنوان ژورنال: Physical Review Special Topics - Accelerators and Beams
سال: 2015
ISSN: 1098-4402
DOI: 10.1103/physrevstab.18.084401